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Research Article

Thickness determination of MoS2, MoSe2, WS2 and WSe2 on transparent stamps used for deterministic transfer of 2D materials

Najme S. Taghavi1,2, Patricia Gant1(), Peng Huang1,3, Iris Niehues4, Robert Schmidt4, Steffen Michaelis de Vasconcellos4, Rudolf Bratschitsch4, Mar García-Hernández1, Riccardo Frisenda1(), Andres Castellanos-Gomez1 ()
Materials Science Factory, Instituto de Ciencia de Materiales de Madrid (ICMM),Consejo Superior de Investigaciones Científicas (CSIC),Sor Juana Inés de la Cruz 3,28049,Madrid, Spain;
Faculty of Physics,Khaje Nasir Toosi University of Technology (KNTU),Tehrān,19697 64499,Iran;
State Key Laboratory of Tribology,Tsinghua University,Beijing,100084,China;
Institute of Physics and Center for Nanotechnology,University of Münster,48149,Münster, Germany;
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Abstract

Here, we propose a method to determine the thickness of the most common transition metal dichalcogenides (TMDCs) placed on the surface of transparent stamps, used for the deterministic placement of two-dimensional materials, by analyzing the red, green and blue channels of transmission-mode optical microscopy images of the samples. In particular, the blue channel transmittance shows a large and monotonic thickness dependence, making it a very convenient probe of the flake thickness. The method proves to be robust given the small flake-to-flake variation and the insensitivity to doping changes of MoS2. We also tested the method for MoSe2, WS2 and WSe2. These results provide a reference guide to identify the number of layers of this family of materials on transparent substrates only using optical microscopy.

Keywords

transition metal dichalcogenidesoptical identificationtransparent substratetrasmittance

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Nano Research
Volume 12 Issue 7,
July 2019
Pages 1691-1695
DOI: 10.1007/s12274-019-2424-6
Cite this article:
Taghavi NS, Gant P, Huang P, et al. Thickness determination of MoS2, MoSe2, WS2 and WSe2 on transparent stamps used for deterministic transfer of 2D materials. Nano Research, 2019, 12(7): 1691-1695. https://doi.org/10.1007/s12274-019-2424-6
Topics:
Molybdenum compoundsOptical data storageOptical microscopySubstratesTransition metalsTungsten compounds
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