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The correlation of single-particle imaging and absorption spectroscopy made the development of sizing curves possible and enabled rapid size determination of semiconductor nanocrystals based solely on optical properties. The increasing demand and production of such materials has resulted in a question of comparability between existing models and adequate volume-weighted size-determining measurement techniques. Small-angle X-ray scattering (SAXS) is a well-established method for obtaining nanostructural information from particle systems while operating sample quantities up to a commercial scale with a large amount of statistically based data. This work utilizes laboratory SAXS to characterize cadmium selenide nanocrystals with band edge energies between 1.97 and 3.08 eV. The evaluation of the scattering patterns is based on an indirect Fourier transformation (IFT), while dimensional parameters are derived from the model-free pair distance distribution functions (Dmode and Dg), as well as the modeled volume (
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