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Research Article

High resolution and high signal-to-noise ratio imaging with near-field high-order optical signals

Fei Wang1,2, Shuming Yang1,2( ), Shaobo Li1,2, Shuhao Zhao1,2, Biyao Cheng1,2, Chengsheng Xia1,2
State Key Laboratory for Manufacturing Systems Engineering, International Joint Laboratory for Micro/Nano Manufacturing and Measurement Technologies, Xi’an Jiaotong University, Xi’an 710049, China
School of Mechanical Engineering, Xi’an Jiaotong University, Xi’an 710049, China
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Graphical Abstract

The scattered near-field 7th order optical imaging results are obtained using a platinum-coated probe, and the experimental results show that the high-order signals have the characteristics of high imaging contrast, high signal-to-noise ratio, and high resolution. It overcomes the limitations of resolution by the tip size.

Abstract

The properties of near-field optics have always been the focus of nano-measurement technology. The 11th order effective near-field optical signal with an incident laser wavelength of 1,550 nm is obtained using a platinum-coated optical probe (Pt–Si probe). The experimental results show that the local electric field intensity of the Pt–Si probe is nearly 30 times higher than that of silicon probe (Si probe). Therefore, the highest 7th order near-field optical imaging results are obtained with the Pt–Si probe. Further, near-field optical imaging is performed on samples such as gold grids and carbon nanotubes using the Pt–Si probe. The measurement results show that the high-order signal has the characteristics of less background, higher signal-to-noise ratio, and resolution up to 5.7 nm.

Keywords

high-order optical signallocal electric field enhancementhigh resolutionoptical probe

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Nano Research
Volume 15 Issue 9,
September 2022
Pages 8345-8350
DOI: 10.1007/s12274-022-4422-3
Cite this article:
Wang F, Yang S, Li S, et al. High resolution and high signal-to-noise ratio imaging with near-field high-order optical signals. Nano Research, 2022, 15(9): 8345-8350. https://doi.org/10.1007/s12274-022-4422-3
Topics:
Near field scanning optical microscopy

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Received: 16 February 2022
Revised: 11 April 2022
Accepted: 12 April 2022
Published: 31 May 2022
© Tsinghua University Press 2022
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