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With the packing density growing continuously in integrated electronic devices, sufficient heat dissipation becomes a serious challenge. Recently, dielectric materials with high thermal conductivity have brought insight into effective dissipation of waste heat in electronic devices to prevent them from overheating and guarantee the performance stability. Layered CrOCl, an anti-ferromagnetic insulator with low-symmetry crystal structure and atomic level flatness, might be a promising solution to the thermal challenge. Herein, we have systematically studied the thermal transport of suspended few-layer CrOCl flakes by micro-Raman thermometry. The CrOCl flakes exhibit high thermal conductivities along zigzag direction, from ~ 392 ± 33 to ~ 1,017 ± 46 W·m−1·K−1 with flake thickness from 2 to 50 nm. Besides, pronounced thickness-dependent thermal conductivity ratio (
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