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Research Article

Substrate orientation effect in covalent organic frameworks/2D materials heterostructure by high-resolution atomic force microscopy

Lu Wang1,2, Cheng Lu1,2, Huijuan Yan1,2, Dong Wang1,2( )
CAS Key Laboratory of Molecular Nanostructure and Nanotechnology, CAS Research/Education Center for Excellence in Molecular Sciences, Beijing National Laboratory for Molecular Science (BNLMS), Institute of Chemistry, Chinese Academy of Sciences, Beijing 100190, China
University of Chinese Academy of Sciences, Beijing 100049, China
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Graphical Abstract

High-quality monolayer covalent organic frameworks (COFs) were successfully constructed on typical two-dimensional (2D) materials. High-resolution atomic force microscopy (HR-AFM) imaging clearly reveals the substrate orientation effect in COFs/2D materials heterostructure.

Abstract

Heterostructures based on covalent organic frameworks (COFs) and other two-dimensional (2D) materials attract considerable attention due to their extraordinary properties and tremendous application potential. Substrate effects play a crucial role in the integration of ultrathin COF films onto 2D materials through direct polymerization. In this study, highly ordered monolayer COFs were successfully constructed on the surfaces of highly oriented pyrolytic graphite (HOPG), hexagonal boron nitride (hBN), and molybdenum disulfide (MoS2). High-resolution atomic force microscopy (HR-AFM) imaging clearly reveals the substrate orientation effect in COFs/2D materials heterostructure. Honeycomb networks formed via Schiff-base reaction and boronic acid condensation reaction can epitaxially grow in specific orientations relative to the underlying substrate lattices. This work provides direct evidence for substrate effects in the on-surface synthesis of COFs and paves the way for further investigation into the intrinsic electronic properties of monolayer COFs and the development of multifunctional hybrid devices.

Keywords

substrate orientation effectcovalent organic frameworks (COFs)on-surface synthesishigh-resolution atomic force microscopy (HR-AFM)

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Nano Research
Volume 16 Issue 7,
July 2023
Pages 10047-10052
DOI: 10.1007/s12274-023-5704-0
Cite this article:
Wang L, Lu C, Yan H, et al. Substrate orientation effect in covalent organic frameworks/2D materials heterostructure by high-resolution atomic force microscopy. Nano Research, 2023, 16(7): 10047-10052. https://doi.org/10.1007/s12274-023-5704-0
Topics:
Scanning probe microscopySurface structure

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Received: 11 January 2023
Revised: 23 March 2023
Accepted: 02 April 2023
Published: 10 May 2023
© Tsinghua University Press 2023
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