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Research Article | Open Access

Long-term stability of transparent n/p ZnO homojunctions grown by rf-sputtering at room-temperature

V. KampylafkaaA. KostopoulosaM. ModreanubM. SchmidtbE. Gagaoudakisc,dK. TsagarakiaV. KontomitrouaG. KonstantinidisaG. DeligeorgisaG. Kiriakidisc,dE. Aperathitisa()
Microelectronics Research Group, Institute of Electronic Structure and Laser, Foundation for Research and Technology—FORTH-Hellas, P.O. Box 1385, Heraklion, 70013, Crete, Greece
Tyndall National Institute-University College Cork, Lee Maltings, Dyke Parade, Cork, Ireland
Physics Department, University of Crete, P.O. Box 2208, 71003, Heraklion, Crete, Greece
Transparent Conductive Materials & Devices Group, Institute of Electronic Structure & Laser, Foundation for Research and Technology FORTH-Hellas, P.O. Box 1385, Heraklion, 70013, Crete, Greece
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Abstract

ZnO-based n/p homojunctions were fabricated by sputtering from a single zinc nitride target at room temperature on metal or ITO-coated glass and Si substrates. A multi-target rf-sputtering system was used for the growth of all oxide films as multilayers in a single growth run without breaking the vacuum in the growth chamber. The nitrogen-containing films (less than 1.5 at.% of nitrogen) were n-type ZnO when deposited in oxygen-deficient Ar plasma (10% O2) and p-type ZnO when deposited in oxygen-rich Ar plasma (50% O2). The all-oxide homojunction ITO/n-ZnO/p-ZnO/ITO/glass was fabricated in a single deposition run and exhibited visible transparency in the range of 75–85%. The n/p ZnO homojunctions, having metallic contacts, formed on conventionally processed substrates showed a fairly unstable behavior concerning the current-voltage characteristics. However, the same homojunctions formed on Si3N4-patterned substrates and stored in atmosphere for a period of five months were stable exhibiting a turn-on voltage of around 1.5 V. The realization of a room temperature sputtered transparent and stable ZnO homojunction paves the way to the realization of all-oxide transparent optoelectronic devices.

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Journal of Materiomics
Pages 428-435
Cite this article:
Kampylafka V, Kostopoulos A, Modreanu M, et al. Long-term stability of transparent n/p ZnO homojunctions grown by rf-sputtering at room-temperature. Journal of Materiomics, 2019, 5(3): 428-435. https://doi.org/10.1016/j.jmat.2019.02.006
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