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Open Access

Characterization of Electrical Tree Degradation of Epoxy Resin under Thermal and Temperature Stresses by Photoelastic Effect

Hein Htet Aung1,#, Yuhuai Wang1,#, Jin Li1( ), Ying Zhang2( ), Tatsuo Takada3
School of Electrical and Information Engineering, Tianjin University, Tianjin 300072, China
Department of Power Generation and Transformation Engineering, Baoding Technical College of Electric Power, Baoding 071051, China
Measurement and Electric Machine Control Laboratory, Tokyo City University, Tokyo 158-8557, Japan

# These authors contributed to this work equally.

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Graphical Abstract

Epoxy resin is widely used in the support, insulation, and packaging components of electrical equipment owing to their excellent insulation, thermal, and mechanical properties. However, epoxy-resin insulation often suffers from thermal and mechanical stresses under extreme environmental conditions and a compact design, which can induce electrical tree degradation and insulation failure in electrical equipment. In this study, the photoelastic method is employed to investigate the thermal-mechanical coupling stress dependence of the electrical treeing behavior of epoxy resin. Typical electrical tree growth morphology and stress distribution were observed using the photoelastic method. The correlation between the tree length and overall accumulated damage with an increase in mechanical stress is determined. The results show that compressive stress retards the growth of electrical trees along the electric field, while tensile stress has accelerating effects. This proves that the presence of thermal stress can induce more severe accumulated damage.

Abstract

Epoxy resin is widely used in the support, insulation, and packaging components of electrical equipment owing to their excellent insulation, thermal, and mechanical properties. However, epoxy-resin insulation often suffers from thermal and mechanical stresses under extreme environmental conditions and a compact design, which can induce electrical tree degradation and insulation failure in electrical equipment. In this study, the photoelastic method is employed to investigate the thermal-mechanical coupling stress dependence of the electrical treeing behavior of epoxy resin. Typical electrical tree growth morphology and stress distribution were observed using the photoelastic method. The correlation between the tree length and overall accumulated damage with an increase in mechanical stress is determined. The results show that compressive stress retards the growth of electrical trees along the electric field, while tensile stress has accelerating effects. This proves that the presence of thermal stress can induce more severe accumulated damage.

Keywords

Epoxy resinthermal stressmechanical stresselectrical tree degradationphotoelastic effects

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Chinese Journal of Electrical Engineering
Volume 10 Issue 1,
March 2024
Pages 12-20
DOI: 10.23919/CJEE.2023.000047
Cite this article:
Aung HH, Wang Y, Li J, et al. Characterization of Electrical Tree Degradation of Epoxy Resin under Thermal and Temperature Stresses by Photoelastic Effect. Chinese Journal of Electrical Engineering, 2024, 10(1): 12-20. https://doi.org/10.23919/CJEE.2023.000047

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Received: 10 October 2023
Revised: 12 November 2023
Accepted: 20 November 2023
Published: 31 March 2024
© 2024 China Machinery Industry Information Institute
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