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Open Access

Evaluation System and Correlation Analysis for Determining the Performance of a Semiconductor Manufacturing System

Department of Control Science and Engineering, College of Electronics and Information Engineering, Shanghai Institute of Intelligent Science and Technology, and also with Shanghai Research Institute for Intelligent Autonomous Systems, Tongji University, Shanghai 201804, China
Department of Mechanical Engineering, School of Engineering, Cardiff University, The Parade, CF24 3AA, UK
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Abstract

Numerous performance indicators exist for semiconductor manufacturing systems. Several studies have been conducted regarding the performance optimization of semiconductor manufacturing systems. However, because of the complex manufacturing processes, potential complementary or inhibitory correlations may exist among performance indicators, which are difficult to demonstrate specifically. To analyze the correlation between the performance indicators, this study proposes a performance evaluation system based on the mathematical significance of each performance indicator to design statistical schemes. Several samples can be obtained by conducting simulation experiments through the performance evaluation system. The Pearson correlation coefficient method and canonical correlation analysis are used on the received samples to analyze linear correlations between the performance indicators. Through the investigation, we found that linear and other complex correlations exist between the performance indicators. This finding can contribute to our future studies regarding performance optimization for the scheduling problems of semiconductor manufacturing.

References

[1]

Q. Yu, H. Yang, K. Yi. Lin, and L. Li, A self-organized approach for scheduling semiconductor manufacturing systems, J. Int. Manuf., vol. 32, no. 3, pp. 689–706, 2021.

[2]

R. Singh and M. Mathirajan, Experimental investigation for performance assessment of scheduling policies in semiconductor wafer fabrication-a simulation approach, Int. J. Adv. Manuf. Technol., vol. 99, nos. 5–8, pp. 1503–1520, 2018.

[3]

H. Y. Sang, P. Y. Duan, and J. Q. Li, An effective invasive weed optimization algorithm for scheduling semiconductor final testing problem, Swarm Evol. Comput., vol. 38, pp. 42–53, 2018.

[4]

F. J. Yang, N. Q. Wu, Y. Qiao, M. C. Zhou, and Z. W. Li, Scheduling of single-arm cluster tools for an atomic layer deposition process with residency time constraints, IEEE Trans. Syst. Man Cybern.:Syst., vol. 47, no. 3, pp. 502–516, 2017.

[5]

J. H. Pang, H. M. Zhou, Y. C. Tsai, and F. D. Chou, A scatter simulated annealing algorithm for the bi-objective scheduling problem for the wet station of semiconductor manufacturing, Comput. Ind. Eng., vol. 123, pp. 54–66, 2018.

[6]

F. Qiao, X. Xu, M. Fang, and Q. Wu, Performance evaluation system for scheduling semiconductor wafer product line, (in Chinese), J. Tongji Univ., vol. 35, no. 4, pp. 537–542, 2007.

[7]
N. Hinrichs, P. Leppelt, and E. Barke, Building up a performance measurement system to determine productivity metrics of semiconductor design projects, in Proc. 2007 IEEE Int. Engineering Management Conf., Lost Pines, TX, USA, 2007, pp. 327–329.
[8]
N. Hinrichs and E. Barke, Applying performance management on semiconductor design processes, in Proc. 2008 IEEE Int. Conf. Industrial Engineering and Engineering Management, Singapore, 2008, pp. 278–281.
[9]
Z. G. Zhou and O. Rose, A bottleneck detection and dynamic dispatching strategy for semiconductor wafer fabrication facilities, in Proc. 2009 Winter Simulation Conf., Austin, TX, USA, 2009, pp. 1646–1656.
[10]
H. Zhang, Z. B. Jiang, Y. F. Lee, C. P. Ko, C. O. T. Luke, and L. P. Lim, An approach of dynamic bottleneck machine dispatching for semiconductor wafer fab, in Proc. 2007 Int. Symp. Semiconductor Manufacturing, Santa Clara, CA, USA, 2007, pp. 1–4.
[11]
H. R. Tsai and T. Chen, Self-adaptive agent-based dynamic scheduling for a semiconductor manufacturing factory, in Proc. 10th Int. Conf. Simulation of Adaptive Behavior, Osaka, Japan, 2008, pp. 519–528.
[12]

H. J. Yoon and J. G. Kim, Heuristic scheduling policies for a semiconductor wafer fabrication facility: minimizing variation of cycle times, Int. J. Adv. Manuf. Technol., vol. 67, nos. 1–4, pp. 171–180, 2013.

[13]

K. Nemoto, E. Akcali, and R. M. Uzsoy, Quantifying the benefits of cycle time reduction in semiconductor wafer fabrication, IEEE Trans. Electron. Packag. Manuf., vol. 23, no. 1, pp. 39–47, 2000.

[14]

H. X. Zhong, M. Liu, J. H. Hao, and S. L. Jiang, An operation-group-based soft scheduling approach for uncertain semiconductor wafer fabrication system, IEEE Trans. Syst. Man Cybern.:Syst., vol. 48, no. 8, pp. 1332–1347, 2018.

[15]

K. Y. Lin, A. Yu, P. C. Chu, and C. F. Chien, User-experience-based design of experiments for new product development of consumer electronics and an empirical study, J. Proc. Ind. Eng., vol. 34, no. 7, pp. 504–519, 2017.

[16]

H. Kwon and N. M. Nasrabadi, Kernel matched subspace detectors for hyperspectral target detection, IEEE Trans. Pattern Anal. Mach. Intell., vol. 28, no. 2, pp. 178–194, 2006.

[17]

Y. T. Kao, S. Dauzère-Pérès, J. Blue, and S. C. Chang, Impact of integrating equipment health in production scheduling for semiconductor fabrication, Comput. Ind. Eng., vol. 120, pp. 450–459, 2018.

[18]

Y. J. Gu, J. Xu, Q. Q. Li, H. F. Li, and D. C. Chen, Fuzzy comprehensive evaluation method for peak shaving capability of coal-fired power units, (in Chinese), Thermal Power Generation, vol. 46, no. 2, pp. 15–21, 2017.

[19]

S. J. Qin and Y. Zheng, Quality-relevant and process-relevant fault monitoring with concurrent projection to latent structures, AIChE J., vol. 59, no. 2, pp. 496–504, 2013.

[20]
M. B. Blaschko, C. H. Lampert, and A. Gretton, Semi-supervised laplacian regularization of kernel canonical correlation analysis, in Proc. European Conf. Machine Learning and Knowledge Discovery in Databases, Antwerp, Belgium, 2008, pp. 133–145.
[21]

F. Pan and X. S. Qian, Methods of optimization for throughput and cycle time in semiconductor wafer fabrication, (in Chinese), Semiconductor Technology, vol. 29, no. 2, pp. 41–45, 2004.

[22]

S. H. Chung and H. W. Huang, Loading allocation algorithm with machine capability restrictions for wafer fabrication factories, J. Chin. Inst. Ind. Eng., vol. 18, no. 4, pp. 82–96, 2001.

[23]

H. B. Li, G. Z. He, and Q. T. Guo, Similarity retrieval method of organic mass spectrometry based on the Pearson correlation coefficient, (in Chinese), Chem. Anal. Met., vol. 24, no. 3, pp. 33–37, 2015.

[24]

H. Hotelling, Relations between two sets of variates, Biometrika, vol. 28, nos. 3&4, pp. 321–377, 1936.

[25]

L. Li, Y. Wang, and K. Y. Lin, Preventive maintenance scheduling optimization based on opportunistic production-maintenance synchronization, J. Intell. Manuf., vol. 32, no. 2, pp. 545–558, 2021.

[26]

C. F. Chien, K. Y. Lin, J. B. Sheu, and C. H. Wu, Retrospect and prospect on operations and management journals in Taiwan: From Industry 3.0 to Industry 3.5, (in Chinese), J. of Mgt., vol. 33, no. 1, pp. 87–103, 2016.

Complex System Modeling and Simulation
Pages 218-231
Cite this article:
Yu Q, Li L, Zhao H, et al. Evaluation System and Correlation Analysis for Determining the Performance of a Semiconductor Manufacturing System. Complex System Modeling and Simulation, 2021, 1(3): 218-231. https://doi.org/10.23919/CSMS.2021.0015

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Received: 29 April 2021
Revised: 18 June 2021
Accepted: 25 June 2021
Published: 29 October 2021
© The author(s) 2021

The articles published in this open access journal are distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/).

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