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Research Article | Open Access

Structure, far-infrared spectroscopy, microwave dielectric properties, and improved low-temperature sintering characteristics of tri-rutile Mg0.5Ti0.5TaO4 ceramics

Hongyu Yanga( ), Liang Chaia, Guangchao Lianga, Mengjiang Xingb,c,d, Zixuan Fange, Xing Zhangf, Tianying Qinb,c, Enzhu Lib,c( )
Academy of Advanced Interdisciplinary Research, Xidian University, Xi’an 710071, China
National Engineering Research Center of Electromagnetic Radiation Control Materials, University of Electronic Science and Technology of China, Chengdu 610054, China
Key Laboratory of Multi-Spectral Absorbing Materials and Structures of Ministry of Education, University of Electronic Science and Technology of China, Chengdu 610054, China
Yangtze Delta Region Institute (Huzhou), University of Electronic Science and Technology of China, Huzhou 313001, China
School of Materials and Energy, University of Electronic Science and Technology of China, Chengdu 611731, China
Sichuan Province Key Laboratory of Information Materials and Devices Application, Chengdu University of Information Technology, Chengdu 610225, China
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Graphical Abstract

Abstract

In this study, tri-rutile type Mg0.5Ti0.5TaO4 ceramics were synthesized, where the structure–property relationship, especially the structural configuration and intrinsic dielectric origin of Mg0.5Ti0.5TaO4 ceramics, and the low-firing characteristics were studied. It is found that the tri-rutile structural type is unambiguously identified through the Rietveld refinement analysis, the selected area electron diffraction (SAED), and the high-resolution transmission electron microscopy (HRTEM) along the [110] zone axis. With the increase in sintering temperature, the densification and uniformity of crystal growth play important roles in regulating the microwave dielectric properties of Mg0.5Ti0.5TaO4 ceramics. Intrinsically, theoretical dielectric properties calculated by the far-infrared reflective spectra approached the experimental values, indicating the importance of structural features to dielectric properties. Furthermore, a glass additive with high matching relevance with ceramics has been developed to decrease the high sintering temperature of Mg0.5Ti0.5TaO4 ceramics, where 2–4 wt% Li2O–MgO–ZnO–B2O3–SiO2 (LMZBS) glass frit was adopted to reduce the suitable temperature from 1275 to 1050 ℃ without significantly deteriorating the microwave dielectric characteristics. Specifically, Mg0.5Ti0.5TaO4 ceramics containing 2 wt% glass addition sintered at 1050 ℃ for 4 h possess excellent microwave dielectric properties: dielectric constant (εr) = 44.3, quality factor multiplied by resonant frequency (Q×f) = 23,820 GHz (f = 6.2 GHz), and the temperature coefficient of resonant frequency (τf) = 123.2 ppm/℃.

Keywords

Mg0.5Ti0.5TaO4ceramicscrystal structurelow-temperature sintering

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Journal of Advanced Ceramics
Volume 12 Issue 2,
February 2023
Pages 296-308
DOI: 10.26599/JAC.2023.9220683
Cite this article:
Yang H, Chai L, Liang G, et al. Structure, far-infrared spectroscopy, microwave dielectric properties, and improved low-temperature sintering characteristics of tri-rutile Mg0.5Ti0.5TaO4 ceramics. Journal of Advanced Ceramics, 2023, 12(2): 296-308. https://doi.org/10.26599/JAC.2023.9220683

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Received: 23 June 2022
Revised: 19 October 2022
Accepted: 19 October 2022
Published: 10 January 2023
© The Author(s) 2022.

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