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Open Access

Uniform Non-Bernoulli Sequences Oriented Locating Method for Reliability-Critical Gates

Jie Xiao, Zhanhui Shi, Weidong Zhu, Jianhui Jiang( ), Qianwei Zhou, Jungang Lou, Yujiao Huang, Qiou Ji, Ziwen Sun
Department of Computer Science and Technology, Zhejiang University of Technology, Hangzhou 310023, China.
Department of Software Engineering, Tongji University, Shanghai 201804, China.
Department of Information Science, Huzhou University, Huzhou 313000, China.
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Abstract

Hardening reliability-critical gates in a circuit is an important step to improve the circuit reliability at a low cost. However, accurately locating the reliability-critical gates is a key prerequisite for the efficient implementation of the hardening operation. In this paper, a probabilistic-based calculation method developed for locating the reliability-critical gates in a circuit is described. The proposed method is based on the generation of input vectors and the sampling of reliability-critical gates using uniform non-Bernoulli sequences, and the criticality of the gate reliability is measured by combining the structure information of the circuit itself. Both the accuracy and the efficiency of the proposed method have been illustrated by various simulations on benchmark circuits. The results show that the proposed method has an efficient performance in locating accuracy and algorithm runtime.

Keywords

gate-level circuit reliabilityuniform non-Bernoulli sequencesreliability-critical gates

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Tsinghua Science and Technology
Volume 26 Issue 1,
February 2021
Pages 24-35
DOI: 10.26599/TST.2019.9010045
Cite this article:
Xiao J, Shi Z, Zhu W, et al. Uniform Non-Bernoulli Sequences Oriented Locating Method for Reliability-Critical Gates. Tsinghua Science and Technology, 2021, 26(1): 24-35. https://doi.org/10.26599/TST.2019.9010045

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Received: 01 April 2019
Revised: 22 August 2019
Accepted: 28 August 2019
Published: 19 June 2020
© The author(s) 2021.

The articles published in this open access journal are distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/).
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