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Keyword: atomic force microscope-based infrared (AFM-IR)
Research Article
Graphene-coated conductive probes with enhanced sensitivity for nanoIR spectroscopy
Yu-Jiao Xia-Hou, Xu-Cheng Li, En-Ming You, [...], Hong-Peng He, Jun Yi, Jun-Rong Zheng, Hai-Long Wang, Hai-Xin Lin, Zhong-Qun Tian << Fewer
Published: 24 July 2023
2023, 16 (8): 11326-11333
Total 1