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Research Article
A universal calibration method for eliminating topography-dependent current in conductive AFM and its application in nanoscale imaging
Chunlin Hao, Hao Xu, Shiquan Lin, [...], Yaju Zhang, Jinmiao He, Bei Liu, Yuanzheng Zhang, Banghao Wu, Guozhen Shen, Haiwu Zheng << Fewer
Published: 22 April 2024
2024, 17 (7): 6509-6517
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